phelos equipment

• Angular photoluminescence (PL) spectroscopy on organic, quantum-dot, and perovskite light-emitting thin films.
• Angular electroluminescence (EL) spectroscopy on OLEDs and other light-emitting devices.
• Angle dependence of light emission of an OLED and other emitting devices.
• Compatible with top and bottom emitting OLED structures.
• Detection of p- and s-polarized signal, or sweep over polarization angles.
• Determine where emission layer dipoles are emitting & orientation of dipoles.
• Integrated data analysis to determine dipole orientation with one click.
• Coupled to Setfos for advanced parameter extraction and device modeling.
• Flexible contacting of any sample geometry and easy sample alignment.
• Acquire current-voltage-luminance (IVL) curves with the integrated SMU
• Measure: EQE, lm/W, Cd/A, CRI, and CIE coordinates
• Polarizers and macro-extraction lens included. Multiple light sources available.

Phelos is a spectrometer for both Photoluminescence and Electroluminescence measurements. The instrument is equipped with an internal SMU that is used alternatively for the EL or PL characterization.

• Analysis of the Color Efficiency.
• Viewing Angle.
• (EQE, lm/W, Cd/A).
• Fitting of the Emission Zone.
• Emitter Orientation.
• Angular Dependent Analysis of the light emission characteristics.
• Emitter orientation.
• Spectrum and Color per Emission Angle.
• Polarization in Light-Emitting Thin Films.
• Characterization of the Scattering and Down-Conversion in Thin Films
• OLEDs functionalized with Quantum Dots

• Working point
• Efficacy (cd/A)
• CIE coordinates
• Color temperature, CRI
• Spectral Irradiance/Intensity
• Radiance/Radiant Intensity
• Luminous Intensity

• Light Conversion using Perovskite Quantum Dots (fluxim.com)