LITOS Equipment

FLUXIM

litos equipment

LITOS EQUIPMENT (Stress-Test Platform for Degradation Analysis of LEDs)

Litos is an advanced LED stability lifetime measurement system. It has 16, or 32 parallel stressing channels distributed over 4 chambers. The wide range of stress conditions and the possibility of interfacing Litos with Paios for in-depth degradation analysis, make it a primary choice for researchers that want to understand the degradation behaviour of organic, perovskite, and quantum-dots-based LEDs.

  • 16, or 32 individual channels to address multiple LEDs in parallel.
  • 4 chambers with individual humidity sensors.
  • Design customized to the specific sample layout of the customer.
  • The Litos-Paios Integration provides a unique tool to study degradation mechanisms in LEDs.
  • User-friendly software for automatic measurement control and parameter extraction.
  • Stressing at constant current, constant luminance, and constant voltage
  • Compatible with Bottom and Top Emitting LEDs (1 chamber with either BT/TP photodetectors)
  • Individual photodiode for each LED under test (optical separation not possible).
  • Temperature control of the individual sample 0 – 85 °C.


Independent stressing and characterization of up to 32 pixels in 4 chambers
Functionality JV(L), in-situ spectral measurements (PL and EL)
Operations All channels are electrically independent. Temperature controller on stage.
Voltage Range -9 V to 9 V
Maximum Current/Channel 60 mA /channel
Current Resolution Best/typical: 1 μA / 5 μA
Sample Size Up to 20mm diameter.
Sample Holder Custom-made. Photodetectors for top or bottom emission LEDs
Temperature Range 0 – 85°C
Computer Connection USB


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