FLUXiM AG is a Switzerland based company which provide world-class software and hardware for Photovoltaic devices (Perovskites, Tandem, Thin Film, and Organic) & Light Emitting Diodes (QD-LED, O-LED, Perovskite-LED) to characterize electrical, optical emissive properties boost R&D in optoelectronics device research.
Setfos and Laoss, software are designed to simulate LEDs and solar cells (including organic, perovskite, and quantum-dot variants) at both micro and macro scales. Capable of simulating light-outcoupling from OLEDs, light-absorption in thin-film solar cells, and charge generation, transport, and recombination in semiconductor devices.
Paios, Phelos, Litos, and Litos Lite are measurement equipment with embedded analysis software to enable efficient electrical and optical device characterization, parameter extraction, and model validation.
SETFOS is a Swiss made Software developed by FLUXiM AG for modelling & Simulation of Light Emitting Diodes (QD-LED, O-LED, Perovskite-LED) & Photovoltaic devices (Perovskites, Tandem, Thin Film, Organic) to calculate electrical, optical & emissive properties of semiconductor device.
Laoss (large-area organic semiconductor simulation) is a software for design, simulation, and optimization of large-area organic, perovskite solar cells, PV Module and LEDs (displays, lighting panels, Photovoltaic arrays).
Paios performs a large variety of electrical and optical characterizations on organic, perovskite, and quantum-dot LEDs and solar cells with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your R&D.
Phelos is an angular luminescence spectrometer to characterize light-emitting devices and thin films over varied emission and polarization angles.
Litos is an advanced LED stability lifetime measurement system. It has 16, or 32 parallel stressing channels distributed over 4 chambers.
Litos Lite is a platform to perform parallel JV and stability measurements on organic and perovskite solar cells. This innovative characterization hardware can perform JV measurements on up to 56 parallel channels and stress the solar cells with either constant voltage or current.
